{"count":1,"message":"Results returned successfully","results":[{"odiNumber":10319622,"manufacturer":"Toyota Motor Corporation","crash":false,"fire":false,"numberOfInjuries":0,"numberOfDeaths":0,"dateOfIncident":"03/15/2010","dateComplaintFiled":"03/15/2010","vin":"99999999999","components":"ELECTRICAL SYSTEM","summary":"RE: POSSIBLE AREA OF STUDY ON TOYOTA ELECTRONICS.  AS SEMICONDUCTOR JUNCTIONS HAVE BECOME SMALLER THEY HAVE BECOME SUSCEPTIBLE TO \"SINGLE EVENT UPSET\" [SEU]. THE PHENOMENA IS WELL KNOW IN THE STRATEGIC MISSILE AREA AND THE AEROSPACE TECHNOLOGY FIELDS.  THIS PHENOMENA FIRST BECAME A SATELLITE DESIGN ISSUE IN THE LATE 1980S. IT IS DISCUSSED IN THE TECHNICAL LITERATURE OF THE 80S AND 90S.  THIS MAY BE AN AREA OF POSSIBLE INVESTIGATION FOR THE \"TOYOTA PROBLEM\".    NOTE: DISREGARD ANY DATA IN THE FOLLOWING FIELDS. IT IS FICTIOUS FOR THE PURPOSE OF BEING ABLE TO SUBMIT THIS SUGGESTION.    [XXX]  THE JUNCTIONS ARE SO SMALL THAT ATOMIC AND SUB ATOMIC PARTICLES PASS THROUGH THE JUNCTION AND CAUSE IT TO IONIZE. THE IONIZATION LEVEL CAN CAUSE A \"CHANGE OF STATE\" WITHIN THE DEVICE, A LOGIC '1' CHANGES TO A LOGIC '0' WITHOUT INTRODUCING ANY PERMANENT DAMAGE OR LEAVING ANY TRACE EVIDENCE OF THE EVENT.    INFORMATION REDACTED PURSUANT TO THE FREEDOM OF INFORMATION ACT (FOIA), 5 U.S.C. 552(B)(6). *TR","products":[{"type":"Vehicle","productYear":"9999","productMake":"TOYOTA","productModel":"TOYOTA","manufacturer":"Toyota Motor Corporation"}]}]}